We explore the intrinsic physical properties of low-dimensional structures – including carbon nanotubes, semiconducting nanowires and two-dimensional (2D) materials – and how these properties are modified upon interaction with the environment. We make large use of vacuum-based techniques either in-house (SPM, LEED, AES) or at synchrotron radiation facilities (ARPES, XPS), and we use those in combination with other characterization tools (e.g.,  SEM, Raman spectroscopy, XRD).

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